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- Particle size analyzer
- Furnace for crystal fabrication
- Langmuir-Blodgett systems
- Contact angle meters & tensiometers
- Dip coater
- Spin coater
- Flexus thin film stress measurement systems
- FP profiler for large format samples
- Spectroscopic ellipsometers
- QCM-D Quartz Crystal Microbalance
- Spectroscopy
- UV-NIR Spectroradiometer
- Hyperspectral cameras
- Hyperspectral remote sensing systems
- Hyperspectral systems
- Spectroscopic ellipsometers
- Spectrographs
- Detectors for modular spectroscopy
- Cameras and detectors for time-resolved spectroscopy and imaging
- Imaging spectrographs
- Modular optical spectroscopy
- Carbon nanotubes
- FTIR accessories: liquid cells
- FTIR accessories: gas & solid cells
- FTIR accessories: reflection units
- FTIR sample preparation: presses & dies
- FTIR sample preparation: thin film makers
- IR polarizers
- Imaging
- Cameras and detectors for time-resolved imaging and spectroscopy
- Cameras for EUV, X-ray and high-energy particle detection
- CCD, EMCCD and sCMOS cameras for imaging
- Highest speed cameras
- High-speed cameras
- High-speed infrared cameras
- Mid and longwave infrared cameras
- Near infrared and shortwave infrared cameras
- Thermographic NDT and NDE
- Visible range infrared cameras
- Combined microscopes
- Hyperspectral cameras
- Hyperspectral remote sensing systems
- Hyperspectral systems
- Imaging spectrographs
- Light measurement
- Electron microscopy
- AFSEM - correlative AFM and SEM
- Accessories for SEM applications
- Cryo preparation system for scanning electron microscopy
- Detectors for SEM applications
- In situ stages for electron microscopy and µXCT
- In situ TEM sample-management solutions
- Sample preparation for electron microscopy
- Sputter & carbon coaters
- Cryogenics
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- Colored glass filters & sets
- Wire-grid polarizer UV-IR
- Quartz lenses & glass lenses
- Beamsplitters
- Bandpass filters
- Filters for fluorescence and Raman spectroscopy
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