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- Hyperspectral cameras
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- FTIR sample preparation: presses & dies
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- IR polarizers
- Imaging
- Cameras and detectors for time-resolved imaging and spectroscopy
- Cameras for EUV, X-ray and high-energy particle detection
- CCD, EMCCD and sCMOS cameras for imaging
- Highest speed cameras
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- Combined microscopes
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- Hyperspectral systems
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- Light measurement
- Electron microscopy
- AFSEM - correlative AFM and SEM
- Accessories for SEM applications
- Cryo preparation system for scanning electron microscopy
- Detectors for SEM applications
- In situ stages for electron microscopy and µXCT
- In situ TEM sample-management solutions
- Sample preparation for electron microscopy
- Sputter & carbon coaters
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