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- FP profiler for large format samples
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- IR polarizers
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- Cameras and detectors for time-resolved imaging and spectroscopy
- Cameras for EUV, X-ray and high-energy particle detection
- CCD, EMCCD and sCMOS cameras for imaging
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- Combined microscopes
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- Imaging spectrographs
- Light measurement
- Electron microscopy
- AFSEM - correlative AFM and SEM
- Accessories for SEM applications
- Cryo preparation system for scanning electron microscopy
- Detectors for SEM applications
- In situ stages for electron microscopy and µXCT
- In situ TEM sample-management solutions
- Sample preparation for electron microscopy
- Sputter & carbon coaters
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- Colored glass filters & sets
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- Quartz lenses & glass lenses
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