Echelle spectrograph
Mechelle 5000 from Andor Technology
Patented echelle optical design with a spectral band pass from 200 nm to 975 nm and a spectral resolution of λ/Δλ = 5000. The Andor Mechelle spectrograph displays the entire range in a single two-dimensional image and automatically captures the spectrum. The device works without any moving part.
| Features |
|---|
| Compact and robust design |
| Patented optical design |
| Auto-temperature correction |
| N2 purged |
| Pre-aligned detector/spectrograph |
Andor’s new Mechelle ME5000 echelle spectrograph has been designed to provide simultaneous recording of a wide wavelength range (200 - 975 nm) in one acquisition. It has no moving components and is available in a pre-aligned detector/spectrometer format. The Andor Mechelle spectrograph is based on the echelle grating principal and its patented optical design provides extremely low cross-talk and maximum resolution compared with other spectrographs.
Absorption, transmission, reflection
Single molecule spectroscopy
Fluorescence
Hyperspectral imaging
Micro Raman and micro fluorescence
Laser generated breakdown spectroscopy (LIBS)
| Title | Author(s) | Institute | Year | Spectrograph/ Detector |
|---|---|---|---|---|
| Laser induced breakdown spectroscopy | ||||
| Automated 2D elemental mapping by laser-induced breakdown spectroscopy | G. Cairns1, J. Kaiser2 | 1Andor Technology, Belfast, United Kingdom 2Institute of Physical Engineering, Brno University of Technology, Czech Republic | 2014 | Mechelle ME5000 iStar DH734i-18F-031 |
| Application of an Echelle spectrometer for 2D mapping of aluminum alloy surfaces using MicroLIBS | M.T. Taschuk1, M. Tripathi2, A. Hanvey3, R. Al-Wazzan3, Y.Y. Tsui1 and R. Fedosejevs1 | 1 Department of Electrical and Computer Engineering, University of Alberta, Edmonton, Canada, 2 Andor Technology, S. Windsor, USA , 3 Andor Technology, Belfast, United Kingdom | 2007 | Mechelle ME5000 iStar DH734-18U-131 |
Remark:
1iStar 734 replaced by iStar 334
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